In this talk, we present a new approach to optimally and simultaneously design the configuration of a multi-component system and determine a maintenance plan with uncertain future stress exposure. Traditionally, analytical models for system design and maintenance planning have been applied sequentially and thus potentially inefficient. We consider the lifecycle cost of the system under the uncertain future usage stresses on component and system reliability, and develop a two-stage stochastic programming model with recourse to integrate the redundancy allocation and maintenance planning problems. The first stage decision variables determine the selection of component types and the number of components to be used in the system, and these decisions must be made before the uncertainty is revealed. The second-stage variables, involving a recourse function, are the preventive maintenance plan, which defines optimal maintenance times for planned replacement of components under distinct usage scenarios. The model is then extended to a four-stage optimization model to accommodate sequences of decisions over time with random future usage scenarios. The comparisons of the proposed integrated approach to traditional sequential method show advantages of the proposed model in cost saving.
David W. Coit is a Professor in the ISE Department Rutgers University. He received a BS degree in mechanical engineering from Cornell University, an MBA from RPI, and MS and PhD in IE from the U. Pittsburgh. His research focuses on system reliability modeling and optimization, and energy systems optimization. His research has been funded by NSF (including a CAREER award), U.S. Army, U.S. Navy, industry, and power utilities. He has published over 110 peer-reviewed journal papers and over 90 conference papers. He was also a recipient of the P. K. McElroy award, Alain O. Plait award and Willian A. J. Golomski award for best papers and tutorials at the Reliability and Maintainability Symposium (RAMS). He also has over ten years of experience working for IIT Research Institute (IITRI), Rome NY. He is a Department Editor for IISE Transactions and an Associate Editor for Journal of Risk and Reliability, and a member of IIE and INFORMS.